Measuring Wavefront Error at Omega —New! Technical and application notes This tech note describes what wavefront is, how to specify it and how it is measured it with interferometry and direct wavefront sensing methods. Mirror Fluorescence Imaging Thin-film Metrology
Custom Bandpass Filter Flyer Technical and application notes Learn what a bandpass filter is and the features that should be considered when designing a bandpass filter. Omega can design and manufacture a custom filter that will differentiate your product. Bandpass UV Filters IR Filters Linear Variable Filters Defense LIDAR and Optical Communications Flow Cytometry Gas Sensing Fluorescence Imaging Laser Filters Thin-film Metrology
Measuring Sharp Spectral Edges to High Optical Density Conference proceedings 56th Annual Technical Conference Proceedings of the Society of Vacuum Coaters, (2013). Reproduced by permission of the Society of Vacuum Coaters. Longpass Bandpass Capabilities Thin-film Metrology Filter Design
Sub-Nanometer Bandpass Coatings for LIDAR and Astronomy Conference proceedings Proc. SPIE 9612, Lidar Remote Sensing for Environmental Monitoring XV, 96120K (September 1, 2015); http://dx.doi.org/10.1117/12.2208368 Bandpass IR Filters LIDAR and Optical Communications Thin-film Metrology
Ultra-wide Broadband Dielectric Mirrors for Solar Collector Applications Conference proceedings Proc. SPIE 10105, Oxide-based Materials and Devices VIII, 101051L (2017); http://dx.doi.org/10.1117/12.2250632 Mirror Capabilities Thin-film Metrology
Measurement and Alignment of Linear Variable Filters Conference proceedings Proc. SPIE 10539, Photonic Instrumentation Engineering V, 105390Y (2018); http://dx.doi.org/10.1117/12.2290689 Linear Variable Filters Bandpass Thin-film Metrology
Laser-based Assessment of Optical Interference Filters with Sharp Spectral Edges and High Optical Density Peer-Reviewed Papers Surface & Coatings Technology 241 (2014), 54-58 (Oct 5, 2013); http://dx.doi.org/10.1016/j.surfcoat.2013.09.054 Longpass Bandpass Shortpass Capabilities Thin-film Metrology